thin films of doped TCO for PN junction applications: Multi technique characterization semiconductor components

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thin films of doped TCO for PN junction applications: Multi technique characterization semiconductor components

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thin films of doped TCO for PN junction applications: Multi technique characterization semiconductor components

Produktspecifikationer

Märke Our Knowledge Publishing
EAN
  • 9786209143625

Eliva Press

Characterization of the Metals TCO for Applications in Photovoltaic and Optoelectronic

581,16 kr
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Editions Universitaires Europeennes

couches minces de TCO dopés pour applications en jonction PN: Caractérisation multi...

885,17 kr
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LAP LAMBERT Academic Publishing

Advanced Material Properties: Synthesis and Characterization of doped Lithium Aluminium Silicates for Emerging Applications

978,01 kr
Jämför 2 butiker 2 Butiker

Elsevier

Nanoscale Thin Films for Biomedical Applications

2.997,90 kr
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